X-ray photoelectron spectroscopy (XPS)
The X-ray photoelectron spectroscopy (XPS) is used to determine qualitatively and quantitatively the chemical composition of the near-surface areas (top 5-10 nm) of metallic and non-metallic solids. It is mainly used for the non-destructive detection of all the established elements (with the exception of hydrogen) and for the determination of the existing oxidation states of an element.
Contact angle measurements
A measurement of the contact angle allows a quick characterisation of a surface. Is it hydrophilic or hydrophobic? Are there contaminations? Did a coating work or not? Using two different test liquids, the surface energy can be determined.
Equipment: Surftens universal (OEG GmbH)
Please read more on «Contact Angle Measurements» in our Newsletter No. 10
Contactless measurement of the topography using a confocal microscope. From the topography, the roughness parameters can be calculated using extracted profiles or areas.