Surface Analysis

X-ray photoelectron spectroscopy (XPS)

The X-ray photoelectron spectroscopy (XPS) is used to determine qualitatively and quantitatively the chemical composition of the near-surface areas (top 5-10 nm) of metallic and non-metallic solids. It is mainly used for the non-destructive detection of all the established elements (with the exception of hydrogen) and for the determination of the existing oxidation states of an element.

Are you interested? Read more about XPS in our Flyer or about «Surface Analysis» in our Newsletter No. 4

Contact angle measurements

A measurement of the contact angle allows a quick characterisation of a surface. Is it hydrophilic or hydrophobic? Are there contaminations? Did a coating work or not? Using two different test liquids, the surface energy can be determined.

Equipment: Surftens universal (OEG GmbH)

Contact: Roman Heuberger+41 32 644-2022

Please read more on «Contact Angle Measurements» in our Newsletter No. 10

Roughness measurement

Contactless measurement of the topography using a confocal microscope. From the topography, the roughness parameters can be calculated using extracted profiles or areas.

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