Powder + particle analytics
In RMS Foundation we can offer you the following services in the area of powder and particle testing:
Components have particulate contamination on the surface even after thorough cleaning (new particles are also generated under load).
Consequences can cause mechanical as well as biological problems: Nozzles or filters clog, valves jam or bearings block. Particulate contamination on implants can trigger undesirable immune reactions that can lead to implant failure.
Therefore, it is important to know the particulate contaminants or particles generated during movement. Or, in the case of powders as the starting material, to characterize it regularly to ensure good process stability.
We offer the following particle analyses:
|Equipment:||Beckman Coulter LS 13320 (laser diffraction) / Jomesa HFD4 (automated light microscopy, dried filters or glass plate) / scanning electron microscopy (SEM, dried filters)|
|Description:||Determination of the specific surface area of solids according to the BET method (Brunauer, Emmet and Teller) based on gas adsorption. The standard method used is nitrogen adsorption at the temperature of liquid nitrogen.|
|Equipment:||Tristar Plus 3030, Micromeritics|
|Description:||Particle contamination of functionally relevant components or packaging. Particles in liquids. Advanced analysis, material determination of particles and particle analysis by SEM / EDX or FT-IR.|
|Equipment:||Stainless steel vacuum filtration unit Sartorius / washing cabinet Hydac CTU 1040 / analytical balance Mettler AX 205 / filter analysis system Jomesa HFD4 / Scanning electron microscope Zeiss Sigma 300 VP with EDX analysis (AZtec Oxford with UltimMax 40 detector) / FT-IR microscope Bruker Lumos|
|Description:||Particle size analysis is used to determine particle size distributions of granules, powders and suspensions. The size distribution of abrasion particles from wear tests can also be investigated. Laser diffraction and automated microscopy are available as measurement techniques. Laser diffraction produces particle size-dependent diffraction patterns that are detected by a series of detectors and converted into a particle size distribution. In automated microscopy, optical or electron beam-based microscopes are used. A statistically sufficient number of particles is automatically measured on a flat support (e.g. a dried filter). The distribution of length, width and/or equivalent circle diameter can be used for particle size analysis.|
|Equipment:||Beckman Coulter LS 13320 (laser diffraction) / Jomesa HFD4 (automated light microscopy, dried filters or glass plate) / SEM (scanning electron microscopy, dried filters) / FT-IR microscopy|
|Description:||Determination of the residual moisture content via weight loss after intensive drying according to Ph. Eur. Monograph 2.2.32. «Loss on drying» 01/2008:20232.|
|Equipment:||Drying oven Memmert type ULP 500 and UFP 500 / Precision balance Mettler Toledo AX205|