Surface Analytics

At the RMS Foundation we can offer you the following services in the area of surface analyses:

Please also note the following services from other categories

Services for surface analytics

Microscopy:

Special application:

  • Crack inspection: Dye penetration for visualisation of cracks or overlaps.
Chemical surface analysis:
  • X-ray photoelectron spectroscopy (XPS): Chemical analysis of the top 10 nm. Particularly suitable for inorganic materials and determination of oxidation states.
  • SEM with energy dispersive X-ray analysis (EDX): Chemical analysis of small areas such as particles with an information depth of approx. 1 µm.
  • Infrared spectroscopy (FT-IR): Organic analysis of layers or particles on the surface.

Not a chemical analysis, but very sensitive in terms of chemical composition:

  • Contact angle: to measure surface energy and to assess whether a surface is hydrophilic or hydrophobic.
Surface cleanliness:

 

 

Crack testing / PT testing

Description: Penetrant testing to find defects that are open to the test surface (e.g. cracks, overlaps, folds and pores) on all materials, provided the material is not attacked by the test equipment and is not extremely porous.
Standard(s):
  • DIN EN ISO 3452-1 
  • ASTM E 165 
  • ASTM E 1417
Newsletter:  
Equipment: Red dye penetrant or fluorescent penetrant / solvent-based intermediate cleaner / solvent-based wet developer

 

 

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