Scanning electron microscopy (SEM) Overview Surface Analytics

System: Zeiss Sigma 300 VP + UltimMax 40 EDX detector

Documentation of surfaces and fracture surfaces on organic and inorganic samples and components using scanning electron microscopy (SEM) to determine surface topography and structure.

Useful tips:

Suitable samples: Solids
Sample specifications:
  • specimen size (W x D x H): 100 x 100 x 50 mm
  • in special cases also larger samples possible
  • Delivery in clean aluminum foil, clean container (no adhesive tape!)
Range/Options:
  • Materials: polymers, metals, ceramics, minerals
  • Magnification: 5x to 30'000x (theoretically up to 300'000x)
  • Topographies, impurities, inclusions
  • Fracture surface analyses
  • Phase identifications
  • VP Mode (reduced vacuum) Examination of non-conductive samples without sputtering or steaming

 

Application(s)

  • Materials: polymers, metals, ceramics, minerals
  • Magnification: 5x to 30'000x (theoretically up to 300'000x)
  • Topographies, impurities, inclusions
  • Fracture surface analyses
  • Phase identifications
  • VP Mode (reduced vacuum) Examination of non-conductive samples without sputtering or vaporization

Standards

Contact:  Fabrizio Bigolin +41 32 644-2023

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