Energy dispersive micro analysis (EDX)
System: Scanning electron microscope Zeiss Sigma 300 VP + EDX (AZtec Oxford with UltimMax 40 detector)
Qualitative and quantitative analysis of the surface of solid or powder materials using energy dispersive X-ray (EDX) analysis in a scanning electron microscope (SEM) to identify the elements boron to uranium. Quantitative analyses allow the content of selected elements to be determined.
Useful tips:
Suitable samples: | Solid, Powder |
Sample specifications: |
|
Range/Options: |
|
Application(s)
- Elemental composition of various solids
Standards
- ASTM E1508: Quantitative Analyse von Energie-Spektroskopie
Contact: Fabrizio Bigolin +41 32 644-2023 E-mail