In the RMS Foundation the following microscopic methods are at your disposal. All testing services have been accredited according to ISO/IEC 17025.
Light-optical microscopy, stereomicroscopy, macroscopic documentation
Macro- and microscopical documentation of of all kinds of samples.
Scanning electron microscopy (SEM)
The scanning electron microscopy (SEM) is used to document the surfaces and fracture surfaces of organic and inorganic test bodies and component samples to determine the topography and the structure of the surface.
Equipment: Zeiss Sigma 300 VP with a secondary and backscattered electron detector, Alicona MEX Software (3D images, roughness measurements)
Topography and roughness measurement
Contactless measurement of the topography using interferometry, confocal microscopy or focus variation. From the topography, for example the roughness parameters can be determined based on areas or on extracted profiles.
Please read more about Topography- & Roughness measurement in our Newsletter No. 20