X-ray photoelectron spectroscopy (XPS)
The X-ray photoelectron spectroscopy (XPS) is used to determine qualitatively and quantitatively the chemical composition of the near-surface areas (top 5-10 nm) of metallic and non-metallic solids. It allows the non-destructive detection of all the established elements (with the exception of hydrogen and helium) and the determination of the oxidation states of the elements.
XPS-Analysis is mainly used to check the cleanliness of implants, to characterize unknown spots on the surface or to control surface treatments.
Are you interested? Read more about XPS in our Flyer.
Device: Kratos Axis NOVA
Contact: Roman Heuberger, Roman.Heuberger(at)rms-foundation.ch, +41 (0)32 644 14 74
Please read more on «Surface Analysis» in our Newsletter No. 4
Contact Angle Measurements
A measurement of the contact angle allows a quick characterisation of a surface. Is it hydrophilic or hydrophobic? Are there contaminations? Did a coating work or not? Using two different test liquids, the surface energy can be determined.
Device: Surftens universal (OEG GmbH, Frankfurt, Germany)
Contact: Roman Heuberger, Roman.Heuberger(at)rms-foundation.ch, +41 (0)32 644 14 74
Please read more on «Contact Angle Measurements» in our Newsletter No. 10