In the RMS Foundation the following methods of microscopy are at your disposal. Some services have been accredited according to ISO/IEC 17025 (identified by *).
Light-optical microscopy*
The light-optical microscopy allows the microscopic investigation and photographic documentation of section samples and flat inorganic and organic surfaces and objects.
Device: Inverse Light-optical microscope Leica DMI5000 M and Nikon «Epiphot»
Contact: Fabrizio Bigolin, Fabrizio.Bigolin(at)rms-foundation.ch, +41 (0)32 644 12 05
Polarisation microscopy*
The polarisation microscopy is used to examine non-transparent as well as transparent materials by means of incident light or transmitted light microscopy to determine the physical and/or optical properties of predominantly anisotropic objects..
Device: Inverse Light-optical microscope Leica DMI5000 M and Nikon «Epiphot»
Contact: Fabrizio Bigolin, Fabrizio.Bigolin(at)rms-foundation.ch, +41 (0)32 644 12 05
Scanning electron microscopy (SEM)
The scanning elektron microscopy (SEM) is used to document the surfaces and fracture surfaces of organic and inorganic test bodies and component samples to determine the topography and the structure of the surface.
Device: Zeiss EVO MA25 with secondary and backscattered electron detector
Contact: Fabrizio Bigolin, Fabrizio.Bigolin(at)rms-foundation.ch, +41 (0)32 644 12 05
Please read more about scanning electron microscopy in our Newsletter No 6 and Newsletter No 7.
Stereomicroscopy*
The stereomicroscopy is used for the stereo-optical, macroscopic and microscopic examination and photographic documentation of all kinds of surfaces and objects in incident light and in transmitted light.
Device: Stereomikroskop Leica MZ12
Contact: Fabrizio Bigolin, Fabrizio.Bigolin(at)rms-foundation.ch, +41 (0)32 644 12 05